High-frequency response of atomic-force microscope cantilevers

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High-frequency response of atomic-force microscope cantilevers

frequency response of atomic-force microscope cantilevers" (1997). Faculty Publications from the Department of Engineering Mechanics. Paper 2. Recent advances in atomic-force microscopy have moved beyond the original quasistatic implementation into a fully dynamic regime in which the atomic-force microscope cantilever is in contact with an insonified sample. The resulting dynamical system is co...

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Calibration of rectangular atomic force microscope cantilevers

A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid ~typically air!, and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. @Rev. Sci. Instrum. 66, 3...

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GDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers

V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...

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Normal and torsional spring constants of atomic force microscope cantilevers

Two methods commonly used to measure the normal spring constants of atomic force microscope cantilevers are the added mass method of Cleveland et al. @J. P. Cleveland et al., Rev. Sci. Instrum. 64, 403 ~1993!#, and the unloaded resonance technique of Sader et al. @J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 ~1999!#. The added mass method involves measuring the chang...

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Susceptibility of atomic force microscope cantilevers to lateral forces

V-shaped cantilevers are used widely in the atomic force microscope ~AFM! due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established operating principles and intuition, V-shaped AFM cantilevers are generally more prone to the effects of lat...

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 1997

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.365935